• DocumentCode
    1800823
  • Title

    The new underfill materials with high adhesion strength for flip-chip applications

  • Author

    Kotaka, Kiyoshi ; Abe, Yukinari ; Homma, Yoshinobu

  • Author_Institution
    Namics Corp., Niigata, Japan
  • fYear
    1998
  • fDate
    15-17 April 1998
  • Firstpage
    369
  • Lastpage
    373
  • Abstract
    Epoxy acid anhydride materials are normally used as flow-type underfill materials. However, the underfill materials of this type, when humidified, tend to cause delamination at the interface with chips in solder reflow. To solve this problem, increasing the adhesive property of underfill material was attempted by investigating the relationship of adhesion strength with the glass transition temperature, high-temperature elastic modulus, and coefficient of moisture absorption for different resin compositions and different filler contents. As a result, the adhesion strength is higher and soldering heat resistance was found to be improved with higher glass transition temperature compositions. On the other hand, the adhesion strength was not affected by changes in the filler content. Based on these findings, an underfill material with high adhesion strength was developed. This new material did not cause delamination, even when treated by the level 2 JEDEC preconditioning test.
  • Keywords
    adhesion; assembling; delamination; elastic moduli; encapsulation; filled polymers; flip-chip devices; glass transition; integrated circuit packaging; integrated circuit testing; moisture; reflow soldering; adhesion strength; adhesive property; coefficient of moisture absorption; epoxy acid anhydride materials; filler content; filler contents; flip-chip applications; flow-type underfill materials; glass transition temperature; high-temperature elastic modulus; humidification; interface delamination; level 2 JEDEC preconditioning test; resin compositions; solder reflow; soldering heat resistance; underfill material; underfill materials; Absorption; Adhesives; Composite materials; Delamination; Glass; Moisture; Resins; Resistance heating; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEMT/IMC Symposium, 2nd 1998
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    0-7803-5090-1
  • Type

    conf

  • DOI
    10.1109/IEMTIM.1998.704703
  • Filename
    704703