DocumentCode :
1801085
Title :
A study of rough surface scattering effects using the higher-order small slope approximation
Author :
Gilbert, M.S. ; Johnson, J.T.
Author_Institution :
ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
Volume :
1
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
557
Abstract :
Understanding scattering cross sections of randomly rough surfaces is critical for designing terrain and sea surface remote sensing systems. The classical physical optics (PO) and small perturbation methods (SPM) have been applied extensively, but have limitations. Recently developed scattering theories, such as the small slope approximation (SSA) (Voronovich, A. "Wave scattering from rough surfaces", Springer, 1994), attempt to overcome those classical limitations. Although the SSA is formulated as an infinite series, most previous studies examine only the lowest order term. This term, denoted /spl sigma//sup 00/, is second-order in surface "quasi-slope" (Broschat, S.L. and Thorsos, E.I., J. Acoust. Soc. Am., vol.101, p.2615-25, 1997). The second and third terms, /spl sigma//sup 01/ and /spl sigma//sup 11/, respectively, are third and fourth-order corrections in surface "quasi-slope". We present simplified forms for /spl sigma//sup 01/ and /spl sigma//sup 11/ for penetrable surfaces under the assumption of a Gaussian random process surface with an isotropic Gaussian correlation function. These surfaces are, admittedly, simple compared to many natural surfaces, but the Gaussian model is still commonly applied in many studies.
Keywords :
Gaussian processes; approximation theory; backscatter; electromagnetic wave polarisation; electromagnetic wave scattering; remote sensing; rough surfaces; series (mathematics); Gaussian random process; classical physical optics; cross polarization; cross-polarized backscattering; higher-order small slope approximation; isotropic Gaussian correlation function; randomly rough surfaces; rough surface scattering effects; scattering cross sections; sea surface remote sensing systems; small perturbation methods; terrain remote sensing systems; Optical scattering; Optical surface waves; Perturbation methods; Physical optics; Remote sensing; Rough surfaces; Scanning probe microscopy; Sea surface; Surface roughness; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
Type :
conf
DOI :
10.1109/APS.2003.1217520
Filename :
1217520
Link To Document :
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