• DocumentCode
    1801097
  • Title

    Application of Multivalued Test Sequencing to fault diagnosis

  • Author

    Wei, Wang ; QingHua, Hu ; Daren, Yu

  • Author_Institution
    Harbin Inst. of Technol., Harbin
  • fYear
    2007
  • fDate
    Aug. 16 2007-July 18 2007
  • Abstract
    In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through dynamic programming to find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequences problem with multiple test responses.
  • Keywords
    automatic testing; fault diagnosis; optimisation; MVAO*; dynamic programming; fault diagnosis; multivalued AO* algorithm; multivalued heuristic evaluation function; multivalued test sequencing; optimal test sequence; Cost function; Dynamic programming; Electronic equipment testing; Energy measurement; Fault diagnosis; Industrial relations; Instruments; Performance evaluation; Sequential analysis; System testing; Fault diagnosis; heuristic search; test sequencing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-1136-8
  • Electronic_ISBN
    978-1-4244-1136-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2007.4351249
  • Filename
    4351249