Title :
Application of Multivalued Test Sequencing to fault diagnosis
Author :
Wei, Wang ; QingHua, Hu ; Daren, Yu
Author_Institution :
Harbin Inst. of Technol., Harbin
fDate :
Aug. 16 2007-July 18 2007
Abstract :
In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through dynamic programming to find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequences problem with multiple test responses.
Keywords :
automatic testing; fault diagnosis; optimisation; MVAO*; dynamic programming; fault diagnosis; multivalued AO* algorithm; multivalued heuristic evaluation function; multivalued test sequencing; optimal test sequence; Cost function; Dynamic programming; Electronic equipment testing; Energy measurement; Fault diagnosis; Industrial relations; Instruments; Performance evaluation; Sequential analysis; System testing; Fault diagnosis; heuristic search; test sequencing;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4351249