Title :
Experimental assessment of modulated S-parameters reliability in modeling and testing wideband radiofrequency amplifiers
Author :
Angrisani, Leopoldo ; Masi, Alessandro
Author_Institution :
Dipt. di Informatica e Sistemistica, Universita di Napoli Federico II, Italy
Abstract :
The paper intends to show the inadequacy of traditional S-parameters in modeling and testing radiofrequency (RF) amplifiers when operating with wideband signals, such as those involved in emerging wireless and/or wireline communication systems. The use of new parameters, the so-called modulated S-parameters, is encouraged and supported. Their measurement no longer requires a sinusoidal signal as test stimulus but a digitally modulated signal of the same type the RF amplifier has to operate with. The reliability of the new parameters is assessed through a number of experiments conducted on a RF amplifier, mainly addressed to very wide bandwidth industrial and commercial applications. Both sinusoidal and modulated S-parameters are evaluated and their ability in describing the real performance of the amplifier when operating with typical wideband signals, such as those involved in third-generation (3G) communication systems, is compared.
Keywords :
3G mobile communication; S-parameters; cellular radio; circuit testing; code division multiple access; radiofrequency amplifiers; telecommunication equipment testing; wideband amplifiers; 3G communication systems; RF amplifiers; WCDMA; amplifier performance; digitally modulated signal test stimulus; modeling; modulated S-parameters reliability; testing; third-generation communication systems; very wide bandwidth commercial applications; very wide bandwidth industrial applications; wideband radiofrequency amplifiers; wideband signals; wireless communication systems; wireline communication systems; Bandwidth; Broadband amplifiers; Digital modulation; Particle measurements; RF signals; Radio frequency; Radiofrequency amplifiers; Scattering parameters; System testing; Wireless communication;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
Print_ISBN :
0-7803-8248-X
DOI :
10.1109/IMTC.2004.1351252