DocumentCode :
1801246
Title :
Mutual coupling characteristics of binomial and Chebyshev arrays using 16 element patch antennas with choke for repeater systems
Author :
Michishita, N. ; Arai, H. ; Ebine, Y.
Author_Institution :
Graduate Sch. of Eng., Yokohama Nat. Univ., Japan
Volume :
1
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
585
Abstract :
Repeater systems will become practical in the IMT-2000 system in order to provide service in locations where presently radio waves cannot reach. We have examined an antenna structure, in the form of a patch array antenna of 4 elements, for a repeater (Michishita, N. et al., IEE 12th Int. Conf. Antennas and Propagation, 2003). At the edge of the ground plane is a choke structure, and this structure´s parameters effect the FB (front-to-back) ratio. We investigate a 16 element patch array antenna which references the 4 element design method and present the mutual coupling characteristics of the 16 element patch array antennas with chokes. The repression of the FB ratio by a choke is small in the case of the 16 element array, because its side lobe level is large. We examine the effect of restraining the mutual coupling using a binomial and Chebyshev array by controlling the amplitude of each element. The binomial and Chebyshev arrays effect the restraint of the side lobe level, and the mutual coupling can be made less than -100 dB by choosing suitable parameters.
Keywords :
3G mobile communication; UHF antennas; antenna accessories; antenna radiation patterns; electromagnetic coupling; inductors; microstrip antenna arrays; 1.92 to 2.17 GHz; Chebyshev arrays; IMT-2000; binomial arrays; choke; choke structure; front-to-back ratio; mutual coupling characteristics; patch antenna arrays; radiation pattern; repeater systems; Ambient intelligence; Antenna arrays; Chebyshev approximation; Dielectric constant; Dielectric substrates; Inductors; Microstrip antennas; Mutual coupling; Patch antennas; Repeaters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
Type :
conf
DOI :
10.1109/APS.2003.1217526
Filename :
1217526
Link To Document :
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