DocumentCode
1801433
Title
Single event effect proton and heavy ion test results for candidate spacecraft electronics
Author
LaBel, Kenneth A. ; Hawkins, D.K. ; Cooley, J.A. ; Seidleck, Christina M. ; Smith, B.S. ; Stassinopoulos, E.G. ; Marshall, Peter ; Dale, Cameron
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
1994
fDate
34535
Firstpage
64
Lastpage
71
Abstract
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.
Keywords
SRAM chips; analogue integrated circuits; analogue-digital conversion; computer testing; digital integrated circuits; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; ion beam effects; proton effects; space vehicle electronics; transceivers; ADCs; FPGAs; MIL-STD-1553B transceivers; SEE ground test; SRAM; heavy ion test; microprocessor; optoelectronics; proton test; single event effect; spacecraft electronics; Aerospace electronics; BiCMOS integrated circuits; Clocks; Diodes; Electronic equipment testing; Protons; Single event upset; Space technology; Space vehicles; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1994 IEEE
Print_ISBN
0-7803-2022-0
Type
conf
DOI
10.1109/REDW.1994.633037
Filename
633037
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