Title :
Single event effect proton and heavy ion test results for candidate spacecraft electronics
Author :
LaBel, Kenneth A. ; Hawkins, D.K. ; Cooley, J.A. ; Seidleck, Christina M. ; Smith, B.S. ; Stassinopoulos, E.G. ; Marshall, Peter ; Dale, Cameron
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.
Keywords :
SRAM chips; analogue integrated circuits; analogue-digital conversion; computer testing; digital integrated circuits; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; ion beam effects; proton effects; space vehicle electronics; transceivers; ADCs; FPGAs; MIL-STD-1553B transceivers; SEE ground test; SRAM; heavy ion test; microprocessor; optoelectronics; proton test; single event effect; spacecraft electronics; Aerospace electronics; BiCMOS integrated circuits; Clocks; Diodes; Electronic equipment testing; Protons; Single event upset; Space technology; Space vehicles; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1994 IEEE
Print_ISBN :
0-7803-2022-0
DOI :
10.1109/REDW.1994.633037
