Title :
The research of FPGA reliability based on redundancy methods
Author :
Wang Wei ; Jun, Yin ; Mei-jie, Zhang
Author_Institution :
Sch. of Electr. Eng. & Autom., Tianjin Polytech. Univ., Tianjin, China
Abstract :
The digital circuit system base on SRAM-based FPGA is easy to encounter single event radiation effects in the high intensity radiation situation, which may result in many instantaneous or permanent faults. Redundant design is effective method to reduce the problem. The ability and reliability of overcoming the Single Event Effects of various redundant design methods, Triple Modular Redundancy (TMR) method and Partial Reconfiguration (PR) method were analyzed in this paper.
Keywords :
field programmable gate arrays; reliability; SRAM-based FPGA reliability; digital circuit system; high intensity radiation situation; partial reconfiguration method; redundant design method; single event radiation effects; triple modular redundancy method; Automation; Reliability theory; FPGA; Partial Reconfiguration; Redundancy design; Triple Modular Redundancy; single event effects;
Conference_Titel :
Computer Science and Network Technology (ICCSNT), 2011 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4577-1586-0
DOI :
10.1109/ICCSNT.2011.6182273
