DocumentCode
1801449
Title
Observation of heavy ion induced transients in linear circuits
Author
Ecoffet, R. ; Duzellier, S. ; Tastet, P. ; Aicardi, C. ; Labrunee, M.
Author_Institution
CNES, Toulouse, France
fYear
1994
fDate
34535
Firstpage
72
Lastpage
77
Abstract
Linear integrated circuits response is susceptible to be disturbed by heavy ion induced transients. The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsible for anomalies in the Earth Sensor of NASA/CNES TOPEX/POSEIDON satellite. First tests have been performed by Koga et al. (1993). In this paper, we present data which confirm Dr. Koga´s findings.
Keywords
analogue integrated circuits; integrated circuit testing; ion beam effects; operational amplifiers; transients; amplifier stage; heavy ion induced transients; linear integrated circuits; op amps; Analog integrated circuits; Circuit testing; Linear circuits; Operational amplifiers; Oscilloscopes; Power supplies; Pulse amplifiers; Silicon compounds; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1994 IEEE
Print_ISBN
0-7803-2022-0
Type
conf
DOI
10.1109/REDW.1994.633038
Filename
633038
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