• DocumentCode
    1801774
  • Title

    Comments on the problems in DCIM

  • Author

    Irsadi Aksun, M. ; Emre Yavuz, M. ; Dural, G.

  • Author_Institution
    Dept of Electr. & Electron. Eng., Koc Univ., Istanbul, Turkey
  • Volume
    1
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    673
  • Abstract
    For the rigorous analysis of multilayer printed geometries, numerical algorithms based on the method of moments (MoM) are widely favored. The application of the MoM in either the spectral or the spatial domain, requires knowledge of the Green´s functions in the corresponding domain. In the spatial domain, the Green´s functions for stratified media are traditionally represented by the Sommerfeld integral. However, this representation of the Green´s functions is not computationally efficient for use in conjunction with the MoM. To overcome this numerical inefficiency for obtaining the spatial-domain Green´s functions, they have been approximated by complex images using the Sommerfeld identity; hence, the method is named the discrete complex image method (DCIM). As is the case for most approximations, the closed-form Green´s functions have some limitations. Closed-form Green´s functions are accurate for small and moderate distances, but for distances larger than a few wavelengths, they deteriorate violently. Three possible sources of this problem are discussed and misunderstandings are clarified.
  • Keywords
    Green´s function methods; electromagnetic field theory; method of moments; multilayers; Sommerfeld integral; approximations; closed-form Green functions; discrete complex image method; method of moments; multilayer printed geometries; spatial domain; spectral domain; Algorithm design and analysis; Circuits; Frequency; Geometry; Green´s function methods; Kernel; Message-oriented middleware; Nonhomogeneous media; Sampling methods; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1217548
  • Filename
    1217548