Title :
Digitally-intensive RF transceivers in highly scaled CMOS
Author_Institution :
MediaTek Inc., Hsinchu, Taiwan
Abstract :
Fast transistors and increasing device non-ideality in advanced nodes have motivated the development of digitally-intensive RF systems utilizing logic gates and algorithms to combat with analog impairments. In this paper, we will explore the power of such embedded intelligence. There are still constraints mandating device-level enhancement. Strong interactions between device and circuit communities are required to accomplish competitive products.
Keywords :
CMOS logic circuits; logic design; logic gates; radio transceivers; radiofrequency integrated circuits; transistor circuits; CMOS; RF systems; RF transceivers; analog impairments; embedded intelligence; logic gates; Integrated circuit reliability; Logic gates; Noise; Passive filters; Radio frequency; Transistors;
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
Conference_Location :
San Francisco, CA
DOI :
10.1109/IEDM.2014.7047078
