• DocumentCode
    1802781
  • Title

    Two-dimensional characterization of relief microstructures in lithium niobate through digital holographic microscopy

  • Author

    De Nicola, S. ; Ferraro, Pietro ; Finizio, A. ; Grilli, S. ; Sansone, L. ; De Natale, P.

  • Author_Institution
    Ist. di Cibernetica, CNR, Pozzuoli, Italy
  • Volume
    2
  • fYear
    2004
  • fDate
    18-20 May 2004
  • Firstpage
    1344
  • Abstract
    We report on the application of digital holographic microscopy for the investigation and the micro-topography reconstruction of different microstructures realized in bulk lithium niobate by differential etching of reversed ferroelectric domain patterns. These structures have a range of applications in optical ridge waveguides, alignment structures, V-grooves, micro-tips and micro-cantilever beams. Precise control of the surface quality and topography is required. The technique allows us to digitally obtain a high-fidelity surface topography description of the specimen with only one image acquisition, allowing relatively simple and compact set-ups able to give quantitative information on the objects´ morphology. The advantages of this technique, compared to traditional microscopy, are discussed.
  • Keywords
    crystal microstructure; etching; lithium compounds; optical microscopy; surface morphology; surface topography measurement; LiNbO3; V-grooves; alignment structures; differential etching; digital holographic microscopy; microcantilever beams; microstructure 2D characterization; microtips; microtopography reconstruction; morphology; optical ridge waveguides; relief microstructures; reversed ferroelectric domain patterns; surface quality; surface topography; Etching; Holography; Image reconstruction; Lithium niobate; Microscopy; Microstructure; Optical surface waves; Optical waveguides; Surface morphology; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8248-X
  • Type

    conf

  • DOI
    10.1109/IMTC.2004.1351314
  • Filename
    1351314