• DocumentCode
    1803024
  • Title

    Performance of capless self-aligned gate D- and QE-mode p-HEMTs

  • Author

    Kim, Tae-Woo ; Chun, Lang-Soo ; Park, Chul-Seung ; Song, Woo-Keun ; Song, Long-In

  • Author_Institution
    Center for Distrib. Sensor Networks, Gwangju Inst. of Sci. & Technol. (GIST), Gwangju
  • Volume
    1
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    163
  • Lastpage
    165
  • Abstract
    Characteristics of 0.2 mum depletion mode (D) and quasi-enhancement mode (QE) capless InAlAs/InGaAs p-HEMTs having a self-aligned gate (SAG) are reported. The QE SAG capless p-HEMT showed improved output conductance and subthreshold characteristics due to the increased gate-to-channel aspect ratio implemented by using a buried Pt technology. The maximum gm, ION/IOFF, sub-threshold slope, ftau, and fmax of the QE SAG capless p-HEMT were 1.22 S/mm, 2.11 times 105, 65 mV/dec, 210 GHz, and 250 GHz and those of the D SAG capless p-HEMT were 1.12 S/mm, 1.27 times 104, 78 mV/dec, 185 GHz, and 225 GHz, respectively. The QE SAG capless p-HEMT also exhibited a shorter drain delay time than the D SAG capless p-HEMT by about 46%.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; platinum; InAlAs-InGaAs; Pt; depletion mode; drain delay time; frequency 185 GHz; frequency 210 GHz; frequency 225 GHz; frequency 250 GHz; gate-to-channel aspect ratio; high electron mobility transistors; output conductance; quasi-enhancement mode; self-aligned gate; size 0.2 mum; Contact resistance; Etching; HEMTs; Indium gallium arsenide; Indium phosphide; MODFETs; Metallization; Ohmic contacts; Schottky barriers; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1879-4
  • Electronic_ISBN
    978-1-4244-1880-0
  • Type

    conf

  • DOI
    10.1109/ICMMT.2008.4540330
  • Filename
    4540330