DocumentCode :
1803171
Title :
A wide-linear-range subthreshold CMOS transconductor employing the back-gate effect
Author :
Harrison, Reid R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
Volume :
3
fYear :
2002
fDate :
2002
Abstract :
We present a CMOS circuit that utilizes the back-gate effect to extend the linear range of a subthreshold MOS transconductor. Previous designs of wide-linear-range transconductors using bipolar transistors employed multiple differential pairs with input offset voltages used to shift the individual transfer functions. These voltages were chosen to maximize the linear range of the summed differential pair currents. Equivalent offset voltages were generated by sizing emitter areas appropriately. Similar techniques may be applied to MOS circuits by scaling W/L ratios, but transistor size increases exponentially as we extend the linear range by adding more differential pairs. We introduce a method of adding equivalent offset voltages by biasing the back gate (i.e., body) of well devices appropriately. Test circuits built in a standard 0.5 μm CMOS process and using few transistors exhibit improved linear range over standard single-differential-pair transconductors.
Keywords :
CMOS analogue integrated circuits; transfer functions; 0.5 micron; MOS transistor; back-gate effect; differential pair; linear range; offset voltage; subthreshold CMOS transconductor; transfer function; well device; Bipolar transistors; CMOS process; Circuit testing; Cities and towns; Linearization techniques; MOSFETs; Threshold voltage; Transconductance; Transconductors; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
Type :
conf
DOI :
10.1109/ISCAS.2002.1010327
Filename :
1010327
Link To Document :
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