• DocumentCode
    1803426
  • Title

    The use of UC-PBG in millimeter-wave resonator and filter by standard 0.18-μm CMOS technology

  • Author

    Lin, Shuiyang ; Sun, Xiaowei ; Yang, Liwu

  • Volume
    1
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    228
  • Lastpage
    231
  • Abstract
    Size reduction of microwave and millimeter-wave (mm-wave) resonator and filter incorporating a defective uniplanar compact photonic bandgap (UC-PBG) slow-wave structure is investigated in the standard 0.18-mum CMOS technology. Benefited from the multilayer mental technology of the standard 0.18-mum CMOS process, thin film microstrip structure is properly constructed on the lossy silicon substrate to reduce substrate loss. Defected periodic patterns on the ground plane are used to contribute to an enhancement of the effective dielectric constant and the slow-wave factor is 14% increased by the use of UC-PBG ground. Microwave and mm-wave passive circuits including resonator and filter are designed and fabricated. Measured results show that the use of UC-PBG ground has induced a frequency drop of 14% and validate the size reduction concept by using UC-PBG.
  • Keywords
    CMOS integrated circuits; millimetre wave filters; photonic band gap; resonators; UC-PBG slow-wave structure; lossy silicon substrate; microwave filter; microwave resonator; millimeter-wave filter; millimeter-wave resonator; size 0.18 mum; size reduction; standard CMOS technology; thin film microstrip structure; uniplanar compact photonic bandgap; CMOS process; CMOS technology; Dielectric substrates; Microwave filters; Microwave technology; Millimeter wave technology; Nonhomogeneous media; Optical losses; Photonic band gap; Resonator filters; CMOS RFIC; UC-PBG; filter; millimeter-wave; resonator; slow-wave structure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1879-4
  • Electronic_ISBN
    978-1-4244-1880-0
  • Type

    conf

  • DOI
    10.1109/ICMMT.2008.4540347
  • Filename
    4540347