DocumentCode :
1803672
Title :
Nonparametric feature selection for multiple class processes
Author :
Blanz, W.E.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fYear :
1988
fDate :
14-17 Nov 1988
Firstpage :
1032
Abstract :
A method of feature selection is presented that has linear computational complexity, and ways are shown how to use it when the type of the probability density function is unknown. There is no claim that the procedures for nonparametric probability density function estimation are applicable to any thinkable distribution, but the lower bound for the classifier performance estimation, makes the presented measure applicable in most practical cases. Simulations with synthetic test data as well as references to applications with real-world data demonstrate the applicability of the measure discussed
Keywords :
computational complexity; pattern recognition; picture processing; probability; classifier; computational complexity; lower bound; multiple class processes; nonparametric feature selection; pattern recognition; performance estimation; picture processing; probability density function; Bayesian methods; Cost function; Density functional theory; Density measurement; Error analysis; Error correction; Estimation error; Length measurement; Manufacturing processes; Probability density function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1988., 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
0-8186-0878-1
Type :
conf
DOI :
10.1109/ICPR.1988.28432
Filename :
28432
Link To Document :
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