Title :
Nonparametric feature selection for multiple class processes
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
A method of feature selection is presented that has linear computational complexity, and ways are shown how to use it when the type of the probability density function is unknown. There is no claim that the procedures for nonparametric probability density function estimation are applicable to any thinkable distribution, but the lower bound for the classifier performance estimation, makes the presented measure applicable in most practical cases. Simulations with synthetic test data as well as references to applications with real-world data demonstrate the applicability of the measure discussed
Keywords :
computational complexity; pattern recognition; picture processing; probability; classifier; computational complexity; lower bound; multiple class processes; nonparametric feature selection; pattern recognition; performance estimation; picture processing; probability density function; Bayesian methods; Cost function; Density functional theory; Density measurement; Error analysis; Error correction; Estimation error; Length measurement; Manufacturing processes; Probability density function;
Conference_Titel :
Pattern Recognition, 1988., 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
0-8186-0878-1
DOI :
10.1109/ICPR.1988.28432