• DocumentCode
    1803848
  • Title

    Test methodology for low power VLSI neural oscillator circuit

  • Author

    Lee, Young Jun ; Lee, Jihyun ; Heo, Jaeyoung ; Zhang, Fengming ; Kim, Yong Bin ; Lombardi, F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    18-20 May 2004
  • Firstpage
    1546
  • Abstract
    This paper presents new test and verification methodologies, including design techniques targeting a neural oscillator. Because the output signal of a neuron is chaotic, customized verification and test methodologies are required. We have chosen to use MATLAB to verify our experimental results at a simulation level. In this paper we also describe a test circuit used to perform electronic neuron IC testing. We investigate how a subthreshold circuit can reduce power consumption. In our HSPICE simulations, we both validate the proposed test circuit and verify the electronic neuron and synapse circuit.
  • Keywords
    VLSI; chaos; integrated circuit testing; low-power electronics; neural nets; oscillators; CMOS technology; VLSI; electronic neuron IC testing; electronic synapse circuit; low power oscillator; neural oscillator test; neuron chaotic output signal; power consumption reduction; subthreshold circuit; verification; Chaos; Circuit simulation; Circuit testing; Design methodology; Electronic equipment testing; Integrated circuit testing; MATLAB; Neurons; Oscillators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8248-X
  • Type

    conf

  • DOI
    10.1109/IMTC.2004.1351360
  • Filename
    1351360