DocumentCode
1803920
Title
Electron beam characteristic of multi-gap pseudo-spark discharge system
Author
Park, S.S. ; Han, Y.J. ; Lee, B.J. ; Nam, S.H.
Author_Institution
Pohang Accelerator Lab., South Korea
fYear
2001
fDate
17-22 June 2001
Firstpage
406
Abstract
Summary form only given, as follows. A triggered multi-gap pseudo-spark discharge systems (TPDS) was designed and fabricated. The TPDS had ten gaps. The TPDS had been operated up to 35 kV at 60 mTorr of Ar gas. The peak beam current extracted from the anode electrode was measured as a function of external capacitance. The external capacitance was varied from 1 nF to 10 nF. The maximum peak beam current was obtained with 1 nF external capacitance. Typical pulse duration of the electron beam was 30 ns. The density of the electron beam was also investigated by using spectroscopic measurement. The principle of space charge neutralization was adopted for the electron beam density analysis. The measured value of the electron beam density was about 2.5/spl Omega/10/sup 16//cm/sup 3/ with an experimental condition of 1 nF external capacitance, 35 kV charging voltage, and 60 mTorr of He gas.
Keywords
argon; electron beams; electron density; particle beam diagnostics; plasma density; plasma diagnostics; space charge; spark gaps; sparks; 1 nF; 1 to 10 nF; 30 ns; 35 kV; 60 mtorr; Ar; Ar gas; He; He gas; anode electrode; charging voltage; density; design; electron beam; electron beam characteristics; electron beam density; electron beam density analysis; external capacitance; fabrication; maximum peak beam current; multi-gap pseudo-spark discharge system; peak beam current; pseudo-spark discharge systems; pulse duration; space charge neutralization; spectroscopic measurement; Anodes; Argon; Capacitance measurement; Current measurement; Density measurement; Electrodes; Electron beams; Space charge; Spectroscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location
Las Vegas, NV, USA
Print_ISBN
0-7803-7141-0
Type
conf
DOI
10.1109/PPPS.2001.961142
Filename
961142
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