Title :
Modeling & design for variability and reliability
Author :
McConaghy, Trent ; Onodera, Hidetoshi
Author_Institution :
Solido Design
Abstract :
This session explores modeling & design techniques for statistical variability and aging/reliability at the circuit level, and at the device level. It has five presentations/papers.
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330569
