• DocumentCode
    1804119
  • Title

    The electromagnetic characteristics of conducting rough surfaces at millimeter wave frequencies

  • Author

    Ning, Yuemin ; Jiang, Wanshun

  • Author_Institution
    Nat. Key Lab. of Electron. Meas. Technol., Qingdao
  • Volume
    1
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    326
  • Lastpage
    328
  • Abstract
    In course of debugging microwave and millimeter wave devices, we often need to get the accurate electromagnetic models for conducting rough surfaces. In this paper, the electromagnetic characteristics of two-dimensional conducting rough surfaces are studied at millimeter wave frequencies. Machine-fabricated rough surfaces with controlled roughness statistics were examined accurately. The reflecting energy and the absorbing energy of electromagnetic waves are dependent on the surface roughness and the working frequency. Because the millimeter wave has a short wavelength, the characteristics of the reflecting energy and the absorbing energy of electromagnetic waves are affected by the surface roughness strongly. In this paper, the reflecting characteristics and the absorbing characteristics of a series of aluminous rough surfaces are calculated using the electromagnetic field simulation software CST microwave studio from 26 GHz to 40 GHz. The reflecting coefficient and the absorbing characteristics of the rough surfaces are extracted by the simulated data and the statistical analysis methods.
  • Keywords
    computational electromagnetics; millimetre wave propagation; rough surfaces; statistical analysis; CST microwave studio; conducting rough surfaces; electromagnetic characteristics; electromagnetic field simulation software; frequency 26 GHz to 40 GHz; microwave debugging; millimeter wave device; millimeter wave frequencies; reflecting characteristics; statistical analysis; Debugging; Electromagnetic modeling; Electromagnetic scattering; Frequency; Microwave devices; Millimeter wave devices; Millimeter wave technology; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1879-4
  • Electronic_ISBN
    978-1-4244-1880-0
  • Type

    conf

  • DOI
    10.1109/ICMMT.2008.4540376
  • Filename
    4540376