Title :
Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables
Author :
Yu, Bo ; Li, Xin ; Yonemura, James ; Wu, Zhiyuan ; Goo, Jung-Suk ; Thuruthiyil, Ciby ; Icel, Ali
Author_Institution :
Compact Modeling & Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA, USA
Abstract :
In this paper, we investigate the geometry dependence for the local variation of low-frequency noise in MOSFETs via the sum of lognormal random variables. A compact model has been developed and applied to the measured data with excellent match, and therefore enables the coverage of low-frequency noise statistics in circuit design.
Keywords :
MOSFET; integrated circuit design; integrated circuit modelling; integrated circuit noise; MOSFET; circuit design; compact model; geometry dependence; local variation modeling; lognormal random variable; low-frequency noise statistics; Logic gates; Low-frequency noise; MOSFET circuits; MOSFETs; Monte Carlo methods; Semiconductor device modeling;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330573
