DocumentCode :
180472
Title :
Model Development for Monolithically-Integrated E/D-Mode Millimeter-Wave InAlN/AlN/GaN HEMTs
Author :
Jun Ren ; Bo Song ; Xing, Huili Grace ; Shuoqi Chen ; Ketterson, Andrew ; Beam, Edward ; Tso-Min Chou ; Pilla, Manyam ; Hua-Quen Tserng ; Xiang Gao ; Saunier, Paul ; Fay, Patrick
Author_Institution :
Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2014
fDate :
19-22 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Device models to support circuit design efforts using monolithically-integrated enhancement- and depletion-mode high-speed InAlN/AlN/GaN HEMTs are reported. Physically- motivated modifications to the conventional empirical compact models have been included to enhance model accuracy over bias and temperature. The models have been extracted from DC through 110 GHz at baseplate temperatures from 25 °C through 100 °C; good agreement is obtained between measurement results and the extracted model.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; millimetre wave transistors; semiconductor device models; wide band gap semiconductors; InAlN-AlN-GaN; circuit design; depletion-mode; empirical compact models; enhancement-mode; frequency 110 GHz; high-speed InAlN-AlN-GaN HEMT; millimeter wave HEMT; monolithically-integrated E-D-mode HEMT; physically motivated modifications; Current measurement; Gallium nitride; HEMTs; Logic gates; MODFETs; Semiconductor device modeling; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICs), 2014 IEEE
Conference_Location :
La Jolla, CA
Type :
conf
DOI :
10.1109/CSICS.2014.6978570
Filename :
6978570
Link To Document :
بازگشت