• DocumentCode
    1805375
  • Title

    Development of the method of specific volume electrical resistance measurement for semi-conductive materials and testing semi-conductive fiberglass epoxy composites under simultaneous action of vibration and electrical current load

  • Author

    Malamud, R.

  • Author_Institution
    OTO Res. Lab., Henry Ford Health Syst., Sci. Center, Detroit, MI, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    7-10 June 1998
  • Firstpage
    719
  • Abstract
    A method of electrical volume resistance measurement of semiconductive plane-parallel materials-specific volume resistance in perpendicular plane direction for materials and production units without removing specimens from tested material, or damaging test material was developed. This method allows control of specific volume resistance of 100% materials and units with high accuracy during production, during long-term testing and before using. This method was applied during the process of evaluating changes of mechanical and electrical properties of semi-conducting materials as well as evaluating equipment reliability on long-term aging.
  • Keywords
    composite insulating materials; electric resistance measurement; glass fibre reinforced plastics; insulation testing; nondestructive testing; semiconductor materials; vibrations; aging; electrical current load; electrical insulation; equipment reliability; fiberglass epoxy composite; mechanical properties; nondestructive testing; plane-parallel material; semiconductive material; specific volume electrical resistance measurement; vibration; Composite materials; Electric resistance; Electrical resistance measurement; Materials testing; Mechanical factors; Optical fiber devices; Optical fiber testing; Production; Semiconductor device testing; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-4927-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1998.704734
  • Filename
    704734