Title :
Performance analysis of deep sub micron VLSI circuits in the presence of self and mutual inductance
Author :
Chowdhury, Masud H. ; Ismail, Yehea I. ; Kashyap, Chandramouli V. ; Krauter, Byron L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
Abstract :
This paper illustrates the growing significance of self and mutual inductances by examining their effects on performance and characteristic issues like propagation delay, rise time, and overshoots. This paper introduces Elmore-like closed form solutions to analyze the behavior of integrated circuits in the presence of self and mutual inductances. The complexity of the expressions introduced here is linear with the number of elements in the interconnect network, and has Elmore delay accuracy characteristics. The propagation delay and overshoots estimated based on these formulae are within 15% of AS/X simulations for a wide range of interconnects from IBM´s most recent CMOS technology.
Keywords :
CMOS integrated circuits; RC circuits; VLSI; delays; distributed parameter networks; inductance; integrated circuit interconnections; integrated circuit modelling; CMOS technology interconnects; Elmore delay accuracy characteristics; Elmore-like closed form solutions; deep sub micron VLSI circuits; distributed RC models; interconnect network; mutual inductance; overshoots; performance analysis; propagation delay; rise time; self inductance; CMOS technology; Capacitance; Coupling circuits; Delay estimation; Inductance; Integrated circuit interconnections; Integrated circuit technology; Performance analysis; Propagation delay; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010423
