Title :
A comprehensive strategy for implementing BIT [weapon systems]
Author :
Doskocil, Douglas C.
Author_Institution :
GE Autom. Syst. Dept., Burlington, MA, USA
Abstract :
To describe the problem to be solved by a BIT (built-in-test) strategy, the relation of BIT to integrated diagnostics is described, followed by a discussion of the uses of BIT and the inherently self-contradictory nature of BIT´s requirements. Systems allocation issues are described, including the multiple dimensions of BIT, the functions of BIT, and BIT external interfaces. Some particular solutions to the false alarm problem are discussed, followed by a description of approaches to the successful implementation of BIT software and hardware
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; military computing; military systems; weapons; BIT; built-in-test; external interfaces; false alarm; integrated diagnostics; military computing; multiple dimensions; weapon systems; Automatic testing; Costs; Degradation; Fault detection; Hardware; History; Power demand; Process design; System testing; Weapons;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9612