Title :
Lifetime and reliability data of commercial excimer laser power systems modules
Author :
Ness, R. ; Melcher, P. ; Johns, David
Abstract :
Summary form only given, as follows. Since 1996, CYMER has manufactured over 1500 excimer lasers for the application of integrated circuit photolithography. Because reliability and cost of operation (CoO) are critical in the semiconductor industry, it is extremely important to quantify these parameters for the laser and each of the primary modules. Lifetime and reliability data for the initial generation of solid state pulsed power module (SSPPM) units are presented from a number of sources, including more than 750 laser systems in the field in addition to a number of in-house module verification systems. Highly accelerated life test (HALT) experiments have also been implemented at CYMER to help quantify the design margins of these modules with respect to operating parameters such as temperature and voltage. In addition, results will be updated from an experiment involving testing of a SSPPM to over 50B shots where the unit was characterized at several intervals in an attempt to detect any potential signs of degradation which might limit the operational lifetime or cause the unit to fail. To date, no such indications of degradation have been measured. The paper will compare actual reliability and lifetime data from these various sources compared to the original lifetime estimates.
Keywords :
excimer lasers; laser accessories; photolithography; pulsed power supplies; commercial excimer laser power systems modules; in-house module verification systems; integrated circuit photolithography; primary modules; reliability data; semiconductor industry; solid state pulsed power module units; Degradation; Integrated circuit manufacture; Integrated circuit reliability; Life estimation; Life testing; Optical pulse generation; Power lasers; Power system reliability; Semiconductor device manufacture; Semiconductor lasers;
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
DOI :
10.1109/PPPS.2001.961201