• DocumentCode
    18057
  • Title

    Nanobattery Effect in RRAMs—Implications on Device Stability and Endurance

  • Author

    Tappertzhofen, S. ; Linn, Eike ; Bottger, Ulrich ; Waser, Rainer ; Valov, I.

  • Author_Institution
    Inst. of Mater. in Electr. Eng. & Inf. Technol. II, RWTH Aachen Univ., Aachen, Germany
  • Volume
    35
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    208
  • Lastpage
    210
  • Abstract
    The impact of the recently discovered nanobattery effect on the switching, the endurance, and the retention of resistive random access memory devices is demonstrated. We show that the relaxation of the electromotive force voltage may lead to a shift of the resistance level for high resistive states, which is included into device modeling. Based on the extended memristive device model, which accounts for the nanobattery effects, endurance and retention problems can be explained.
  • Keywords
    electric potential; memristors; random-access storage; RRAM; device endurance; device stability; electromotive force voltage; high resistive states; memristive device model; nanobattery effect; resistive random access memory; Electronic countermeasures; Materials; Memristors; Nanoscale devices; Resistance; Switches; Voltage measurement; Resistive switching; endurance; nanobattery; non-equilibrium states; retention;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2292113
  • Filename
    6680600