DocumentCode :
18057
Title :
Nanobattery Effect in RRAMs—Implications on Device Stability and Endurance
Author :
Tappertzhofen, S. ; Linn, Eike ; Bottger, Ulrich ; Waser, Rainer ; Valov, I.
Author_Institution :
Inst. of Mater. in Electr. Eng. & Inf. Technol. II, RWTH Aachen Univ., Aachen, Germany
Volume :
35
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
208
Lastpage :
210
Abstract :
The impact of the recently discovered nanobattery effect on the switching, the endurance, and the retention of resistive random access memory devices is demonstrated. We show that the relaxation of the electromotive force voltage may lead to a shift of the resistance level for high resistive states, which is included into device modeling. Based on the extended memristive device model, which accounts for the nanobattery effects, endurance and retention problems can be explained.
Keywords :
electric potential; memristors; random-access storage; RRAM; device endurance; device stability; electromotive force voltage; high resistive states; memristive device model; nanobattery effect; resistive random access memory; Electronic countermeasures; Materials; Memristors; Nanoscale devices; Resistance; Switches; Voltage measurement; Resistive switching; endurance; nanobattery; non-equilibrium states; retention;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2292113
Filename :
6680600
Link To Document :
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