DocumentCode
18057
Title
Nanobattery Effect in RRAMs—Implications on Device Stability and Endurance
Author
Tappertzhofen, S. ; Linn, Eike ; Bottger, Ulrich ; Waser, Rainer ; Valov, I.
Author_Institution
Inst. of Mater. in Electr. Eng. & Inf. Technol. II, RWTH Aachen Univ., Aachen, Germany
Volume
35
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
208
Lastpage
210
Abstract
The impact of the recently discovered nanobattery effect on the switching, the endurance, and the retention of resistive random access memory devices is demonstrated. We show that the relaxation of the electromotive force voltage may lead to a shift of the resistance level for high resistive states, which is included into device modeling. Based on the extended memristive device model, which accounts for the nanobattery effects, endurance and retention problems can be explained.
Keywords
electric potential; memristors; random-access storage; RRAM; device endurance; device stability; electromotive force voltage; high resistive states; memristive device model; nanobattery effect; resistive random access memory; Electronic countermeasures; Materials; Memristors; Nanoscale devices; Resistance; Switches; Voltage measurement; Resistive switching; endurance; nanobattery; non-equilibrium states; retention;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2013.2292113
Filename
6680600
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