Title :
Study on EM-side channel test for embedded system
Author :
He, Bin ; Wang, Jianzhong ; He, Dake ; Chen, Wenbai
Author_Institution :
Sch. of IS&T, Southwest Jiaotong Univ., Chengdu, China
Abstract :
Aiming at information leakage of embedded systems, electromagnetic side-channel test technology is researched. A communication system model including electromagnetism-side(EM-side) channel of Embedded systems was established and a EM-side test platform was built. Based on this test platform, Encryption key capture experiments of FPGA-based Advanced Encryption Standard (AES) algorithm chip were completed. The proposed algorithm in this paper improves the EM-side differential analysis method in time-domain effectively by solving the signal synchronization, the higher demand of SNR and increasing the sensitivity of analysis. Experiment results show that test platform and the EM-side test and analysis method in this paper are feasible and effective.
Keywords :
cryptography; electromagnetic wave propagation; electromagnetism; embedded systems; field programmable gate arrays; synchronisation; system-on-chip; AES algorithm chip; EM-side channel test; EM-side differential analysis method; FPGA-based advanced encryption standard algorithm chip; SNR; communication system model; electromagnetic side-channel test technology; electromagnetism-side channel; embedded system; encryption key capture experiments; information leakage; signal synchronization; Algorithm design and analysis; Electromagnetics; Embedded systems; Encryption; Logic gates; Oscilloscopes; Probes; Differential cryptanalysis; EM-side channel; Electro Magnetic; Embedded system;
Conference_Titel :
Computer Science and Network Technology (ICCSNT), 2011 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4577-1586-0
DOI :
10.1109/ICCSNT.2011.6182448
