Title :
ICSE 2002. IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.02EX604)
Keywords :
CMOS digital integrated circuits; MOCVD; failure analysis; frequency synthesizers; integrated circuit testing; microsensors; nondestructive testing; optical sensors; phase locked loops; solar cells; CMOS PLL based frequency synthesizer; IC testing; MEMS design; MOCVD growth; MOS capacitors; MOSFETs; fault detection; microwave nondestructive testing; optical sensors; power IC applications; proceedings; semiconductor electronics; semiconductor wafers; solar cells; velocity measurement;
Conference_Titel :
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Conference_Location :
Penang, Malaysia
Print_ISBN :
0-7803-7578-5
DOI :
10.1109/SMELEC.2002.1217762
