DocumentCode
1805846
Title
ICSE 2002. IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.02EX604)
fYear
2002
fDate
19-21 Dec. 2002
Keywords
CMOS digital integrated circuits; MOCVD; failure analysis; frequency synthesizers; integrated circuit testing; microsensors; nondestructive testing; optical sensors; phase locked loops; solar cells; CMOS PLL based frequency synthesizer; IC testing; MEMS design; MOCVD growth; MOS capacitors; MOSFETs; fault detection; microwave nondestructive testing; optical sensors; power IC applications; proceedings; semiconductor electronics; semiconductor wafers; solar cells; velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Conference_Location
Penang, Malaysia
Print_ISBN
0-7803-7578-5
Type
conf
DOI
10.1109/SMELEC.2002.1217762
Filename
1217762
Link To Document