Title :
Behavioral modeling for RF and AMS
Author :
McAndrew, Colin ; Chen, Brian
Author_Institution :
Freescale Semiconductor
Abstract :
The continued increase in functionality and complexity of integrated circuits, especially the integration of analog and RF circuit blocks along with large amounts of digital circuitry, has increased the need for efficient simulation of large analog/mixed-signal (AMS) circuits. This is especially difficult and time-consuming for top-level verification, and for accurate simulation of the nonlinear behavior of high power RF circuits. This session includes three papers that address recent developments in modeling and simulation that expand the scope and improve the accuracy of models and simulation techniques for modern RF transistors and for large AMS systems.
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330641