DocumentCode
1805879
Title
Behavioral modeling for RF and AMS
Author
McAndrew, Colin ; Chen, Brian
Author_Institution
Freescale Semiconductor
fYear
2012
fDate
9-12 Sept. 2012
Firstpage
1
Lastpage
1
Abstract
The continued increase in functionality and complexity of integrated circuits, especially the integration of analog and RF circuit blocks along with large amounts of digital circuitry, has increased the need for efficient simulation of large analog/mixed-signal (AMS) circuits. This is especially difficult and time-consuming for top-level verification, and for accurate simulation of the nonlinear behavior of high power RF circuits. This session includes three papers that address recent developments in modeling and simulation that expand the scope and improve the accuracy of models and simulation techniques for modern RF transistors and for large AMS systems.
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location
San Jose, CA, USA
ISSN
0886-5930
Print_ISBN
978-1-4673-1555-5
Electronic_ISBN
0886-5930
Type
conf
DOI
10.1109/CICC.2012.6330641
Filename
6330641
Link To Document