Title :
SEM: Enterprise Modeling of JSF Global Sustainment
Author :
Smith, V. Devon ; Searles, Donald G. ; Thompson, Bruce M. ; Cranwell, Robert M.
Author_Institution :
Lockedheed Martin Aeronaut., Fort Worth, TX
Abstract :
The joint strike fighter (JSF) program is implementing a paradigm shift to a performance-based logistics environment for force sustainment. This approach produces the necessary levels of performance at a significantly reduced cost of ownership. The resulting logistics environment is multi-national, multi-echelon, and multi-service. The magnitude of the change in the support concept requires an enterprise-level model that can instill customer confidence in unproven alternatives to legacy approaches and capture investment/commitment to enable a profitable execution. The support enterprise model (SEM) was developed by Lockheed Martin to provide a consistent/accurate global view for support of strategic decisions during design/implementation of a JSF global sustainment solution. SEM is a discrete event simulation that allows analysts to define operational/support environment, ascertain measures of effectiveness for performance/cost metrics, and characterize sensitivity to changes in support system architecture, processes, and business approach as well as air vehicle reliability and maintainability characteristics
Keywords :
aerospace computing; aircraft maintenance; corporate modelling; discrete event systems; logistics; reliability; JSF global sustainment; air vehicle maintainability; air vehicle reliability; cost metrics; discrete event simulation; enterprise modeling; force sustainment; joint strike fighter program; multi-echelon; multi-service; performance metrics; performance-based logistics; support system architecture; Aircraft; Contracts; Costs; Discrete event simulation; Logistics; Maintenance; Management training; Performance analysis; Stochastic processes; Vehicles;
Conference_Titel :
Simulation Conference, 2006. WSC 06. Proceedings of the Winter
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0500-9
Electronic_ISBN :
1-4244-0501-7
DOI :
10.1109/WSC.2006.323231