• DocumentCode
    1806667
  • Title

    A wideband ultra-low-current on-chip ammeter

  • Author

    Lu, Junjie ; Holleman, Jeremy

  • Author_Institution
    Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A high-bandwidth ultra-low-current measurement circuit is presented in this paper. The circuit is capable of measuring an on-chip 75 fA current at a bandwidth up to 1 kHz with a noise floor of 0.235 fArms/√Hz. A low leakage reset scheme is utilized to improve the precision. Nested auto-zeroing combined with modified correlated double sampling is employed to mitigate the error due to various circuit imperfections. Noise analysis is carried out and “capacitive noise matching” is proposed to minimize the noise floor. The circuit is also capable of digitizing the measured current and streaming the data through a serial interface. The measurement circuit occupies 0.065 mm2 of active silicon area in a 90 nm CMOS process and consumes 147 μW from 2.5 V and 1V supplies.
  • Keywords
    CMOS integrated circuits; ammeters; integrated circuit measurement; noise; CMOS process; active silicon area; capacitive noise matching; circuit imperfection; current 25 fA; high-bandwidth ultra-low-current measurement circuit; leakage reset scheme; modified correlated double sampling; nested auto-zeroing; noise analysis; noise floor; on-chip 75 fA current; power 147 muW; serial interface; size 90 nm; voltage 1 V; voltage 2.5 V; wideband ultra-low-current on-chip ammeter; Bandwidth; Current measurement; Floors; Logic gates; Noise; Noise measurement; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2012 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4673-1555-5
  • Electronic_ISBN
    0886-5930
  • Type

    conf

  • DOI
    10.1109/CICC.2012.6330668
  • Filename
    6330668