DocumentCode :
1806785
Title :
Ion chromatography analysis of fluorine contamination in wafer packaging materials
Author :
Younan, Hua ; Redkar, Shailesh ; Chi-Kwan, Lau ; Jianhua, Lin
Author_Institution :
Chartered Semicond. Manuf. Ltd, Singapore, Singapore
fYear :
2002
fDate :
19-21 Dec. 2002
Firstpage :
182
Lastpage :
184
Abstract :
So far, it is difficult to determine quantitatively very lower level fluorine in packaging materials in wafer fabrication. In this paper, we will introduce a rapid determination technique, Ion Chromatography, to determine trace of fluorine in packaging foam materials. Using this method, the concentration of fluorine in packaging foam materials can be quantitatively determined very lower level (<4 ng/cm2). The advantages of this method are fast, accurate and repeatable of the results obtained. In this paper, we will introduce this determination method and discuss the details of sample preparation, determination conditions and results.
Keywords :
chromatography; contamination; fluorine; foams; integrated circuit packaging; F; fluorine contamination; ion chromatography; packaging foam materials; sample preparation; wafer fabrication; wafer packaging materials; Assembly; Cleaning; Contamination; Filters; Materials testing; Monitoring; Optical device fabrication; Semiconductor device packaging; Semiconductor materials; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN :
0-7803-7578-5
Type :
conf
DOI :
10.1109/SMELEC.2002.1217801
Filename :
1217801
Link To Document :
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