Title :
A Radiation Hard Lut Block with Auto-Scrubbing
Author :
Haque, Kashfia ; Beckett, Paul
Author_Institution :
Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
Abstract :
We present a Silicon-on-Insulator based Look-up Table and configuration memory for application within a radiation hard reconfigurable system. The configuration storage includes a non-volatile EEPROM built using a standard single poly silicon Silicon on Insulator CMOS process linked to a Schmitt sense amplifier and transmission gate LUT structure. A simple current detector of the type used in conventional RAM circuits allows the configuration memory to be set up to exhibit self correcting, or "auto-scrubbing" behavior. While the SOI EEPROM and Schmitt exhibit high intrinsic resistance to radiation induced errors, it is still possible for a sequence of two particle strikes to cause the configuration value to be lost. We undertake a preliminary analysis of the Single Event error Rate (SER) performance that results from this behavior.
Keywords :
CMOS integrated circuits; EPROM; amplifiers; radiation hardening; random-access storage; reconfigurable architectures; silicon-on-insulator; table lookup; trigger circuits; RAM circuit; SOI EEPROM; Schmitt sense amplifier; Si; autoscrubbing; configuration memory; current detector; nonvolatile EEPROM; radiation hard LUT block; radiation hard reconfigurable system; radiation induced error; silicon-on-insulator based look-up table; single event error rate; standard single polysilicon silicon on insulator CMOS process; transmission gate LUT structure; EPROM; Field programmable gate arrays; Logic gates; Random access memory; Silicon on insulator technology; Table lookup; Transistors; Auto-scrubbing; LUT; Radiation Hard; SOI EEPROM; configuration memory;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2011 International Conference on
Conference_Location :
Chania
Print_ISBN :
978-1-4577-1484-9
Electronic_ISBN :
978-0-7695-4529-5
DOI :
10.1109/FPL.2011.87
