DocumentCode
1806981
Title
Modeling the response of Bang-Bang digital PLLs to phase error perturbations
Author
Abdelfattah, Moataz ; Ghoneima, Maged ; Ismail, Yehea I. ; Lotfy, Amr ; Abdel-moneum, Mohamed ; Kurd, Nasser A. ; Taylor, Greg
Author_Institution
Center of Nanoelectron. & Devices, American Univ. in Cairo/Zewail City, Cairo, Egypt
fYear
2012
fDate
9-12 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
Bang-Bang phase locked loops (BB-PLLs) offer a low power implementation of digital PLLs. However, the response of BB-PLLs, unlike linear PLLs, depends on the magnitude of the phase error, and thus, exhibits hard nonlinearity. This paper presents a generic modeling methodology for digital BB-PLLs in the locked state using simple time domain analysis. The proposed model predicts the response of BB-PLL to a given phase error magnitude in terms of stability (maintaining lock), and settling time (relock time). The model further aids the design process by providing insight for the system response in terms of the loop parameters. An example BB-PLL system is implemented in 32nm technology, and the proposed model is applied. Verified by analog-mixed signal (AMS) simulations, the model was successful in predicting the system response, and indicating stability and settling time of the system for a given phase error magnitude.
Keywords
digital phase locked loops; low-power electronics; perturbation techniques; stability; time-domain analysis; AMS simulations; BB-PLL system; analog-mixed signal simulations; bang-bang digital PLL; bang-bang phase locked loops; design process; digital BB-PLL; generic modeling methodology; linear PLL; locked state; loop parameters; low power implementation; phase error magnitude; phase error perturbations; settling time; stability; system response; time domain analysis; Clocks; Detectors; Mathematical model; Phase locked loops; Predictive models; Stability criteria;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location
San Jose, CA
ISSN
0886-5930
Print_ISBN
978-1-4673-1555-5
Electronic_ISBN
0886-5930
Type
conf
DOI
10.1109/CICC.2012.6330677
Filename
6330677
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