• DocumentCode
    1806981
  • Title

    Modeling the response of Bang-Bang digital PLLs to phase error perturbations

  • Author

    Abdelfattah, Moataz ; Ghoneima, Maged ; Ismail, Yehea I. ; Lotfy, Amr ; Abdel-moneum, Mohamed ; Kurd, Nasser A. ; Taylor, Greg

  • Author_Institution
    Center of Nanoelectron. & Devices, American Univ. in Cairo/Zewail City, Cairo, Egypt
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Bang-Bang phase locked loops (BB-PLLs) offer a low power implementation of digital PLLs. However, the response of BB-PLLs, unlike linear PLLs, depends on the magnitude of the phase error, and thus, exhibits hard nonlinearity. This paper presents a generic modeling methodology for digital BB-PLLs in the locked state using simple time domain analysis. The proposed model predicts the response of BB-PLL to a given phase error magnitude in terms of stability (maintaining lock), and settling time (relock time). The model further aids the design process by providing insight for the system response in terms of the loop parameters. An example BB-PLL system is implemented in 32nm technology, and the proposed model is applied. Verified by analog-mixed signal (AMS) simulations, the model was successful in predicting the system response, and indicating stability and settling time of the system for a given phase error magnitude.
  • Keywords
    digital phase locked loops; low-power electronics; perturbation techniques; stability; time-domain analysis; AMS simulations; BB-PLL system; analog-mixed signal simulations; bang-bang digital PLL; bang-bang phase locked loops; design process; digital BB-PLL; generic modeling methodology; linear PLL; locked state; loop parameters; low power implementation; phase error magnitude; phase error perturbations; settling time; stability; system response; time domain analysis; Clocks; Detectors; Mathematical model; Phase locked loops; Predictive models; Stability criteria;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2012 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4673-1555-5
  • Electronic_ISBN
    0886-5930
  • Type

    conf

  • DOI
    10.1109/CICC.2012.6330677
  • Filename
    6330677