DocumentCode
1807900
Title
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization
Author
Igarashi, Mitsuhiko ; Takeuchi, Kan ; Takazawa, Yoshio ; Igarashi, Yasuto ; Matsushita, Hiroaki
Author_Institution
Design Platform Dev. Div., Renesas Electron. Corp., Tokyo, Japan
fYear
2012
fDate
9-12 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.
Keywords
electric potential; logic testing; sensors; HKMG GHz digital sensor; dynamic voltage drop detection; dynamic voltage-drop sensor; high k metal gate; peak power optimization; size 28 nm; voltage sensitivity; Clocks; DVD; Delay; Logic gates; Monitoring; Radiation detectors; Testing; activity rate; scan test; voltage drop sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location
San Jose, CA
ISSN
0886-5930
Print_ISBN
978-1-4673-1555-5
Electronic_ISBN
0886-5930
Type
conf
DOI
10.1109/CICC.2012.6330710
Filename
6330710
Link To Document