Title :
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization
Author :
Igarashi, Mitsuhiko ; Takeuchi, Kan ; Takazawa, Yoshio ; Igarashi, Yasuto ; Matsushita, Hiroaki
Author_Institution :
Design Platform Dev. Div., Renesas Electron. Corp., Tokyo, Japan
Abstract :
We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.
Keywords :
electric potential; logic testing; sensors; HKMG GHz digital sensor; dynamic voltage drop detection; dynamic voltage-drop sensor; high k metal gate; peak power optimization; size 28 nm; voltage sensitivity; Clocks; DVD; Delay; Logic gates; Monitoring; Radiation detectors; Testing; activity rate; scan test; voltage drop sensor;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330710
