• DocumentCode
    1807910
  • Title

    12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 voltage domains

  • Author

    Muramatsu, Atsushi ; Yasufuku, Tadashi ; Nomura, Masahiro ; Takamiya, Makoto ; Shinohara, Hirofumi ; Sakurai, Takayasu

  • Author_Institution
    Semicond. Technol. Acad. Res. Center, Yokohama, Japan
  • fYear
    2011
  • fDate
    12-16 Sept. 2011
  • Firstpage
    191
  • Lastpage
    194
  • Abstract
    Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations within a functional block are compensated by the fine-grained supply voltage (VDD) control to minimize power at fixed clock frequency. In the 40-nm test chips, the layout of a data encryption core is divided into 6×7 voltage domains. Both high VDD (VDDH) and low VDD (VDDL) are supplied to each power domain and either VDDH or VDDL is adaptively selected according to the setup error warning signals generated by canary flip-flops. Compared with the conventional single VDD operation, the proposed FADVC reduced the power by 12% at 1-MHz clock in the measurement.
  • Keywords
    CMOS logic circuits; cryptography; flip-flops; low-power electronics; voltage control; CMOS logic circuit; VDDH; VDDL; canary flip-flop; data encryption core; error warning signal; fine-grained adaptive dual supply voltage control; fine-grained supply voltage control; frequency 1 MHz; functional block; power reduction; size 40 nm; Automatic voltage control; Clocks; Delay; Layout; Power measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2011 Proceedings of the
  • Conference_Location
    Helsinki
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4577-0703-2
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2011.6044897
  • Filename
    6044897