DocumentCode
1807910
Title
12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 voltage domains
Author
Muramatsu, Atsushi ; Yasufuku, Tadashi ; Nomura, Masahiro ; Takamiya, Makoto ; Shinohara, Hirofumi ; Sakurai, Takayasu
Author_Institution
Semicond. Technol. Acad. Res. Center, Yokohama, Japan
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
191
Lastpage
194
Abstract
Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations within a functional block are compensated by the fine-grained supply voltage (VDD) control to minimize power at fixed clock frequency. In the 40-nm test chips, the layout of a data encryption core is divided into 6×7 voltage domains. Both high VDD (VDDH) and low VDD (VDDL) are supplied to each power domain and either VDDH or VDDL is adaptively selected according to the setup error warning signals generated by canary flip-flops. Compared with the conventional single VDD operation, the proposed FADVC reduced the power by 12% at 1-MHz clock in the measurement.
Keywords
CMOS logic circuits; cryptography; flip-flops; low-power electronics; voltage control; CMOS logic circuit; VDDH; VDDL; canary flip-flop; data encryption core; error warning signal; fine-grained adaptive dual supply voltage control; fine-grained supply voltage control; frequency 1 MHz; functional block; power reduction; size 40 nm; Automatic voltage control; Clocks; Delay; Layout; Power measurement; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location
Helsinki
ISSN
1930-8833
Print_ISBN
978-1-4577-0703-2
Electronic_ISBN
1930-8833
Type
conf
DOI
10.1109/ESSCIRC.2011.6044897
Filename
6044897
Link To Document