• DocumentCode
    1808009
  • Title

    Differential input topologies with immunity to electromagnetic interference

  • Author

    Michel, Fridolin ; Steyaert, Michiel

  • Author_Institution
    Dept. Elektrotech. ESAT-MICAS, K.U. Leuven, Leuven, Belgium
  • fYear
    2011
  • fDate
    12-16 Sept. 2011
  • Firstpage
    203
  • Lastpage
    206
  • Abstract
    Differential input structures and their immunity to electromagnetic interference (EMI) are discussed and measured. EMI signals coupling into analog circuits can have levels of up to 40 Vpp according to recent industrial EMI specifications [6]. In order to maintain circuit operation under such high disturbances several on chip modifications of standard circuitry are proposed. Low EMI levels can be partly handled by high impedance input structures, whereas for the full EMI specification of 40 Vpp a low input impedance structure has been developed, that prevents ESD clipping by EMI attenuation to the chip voltage range while calibrating for mismatch induced signal deterioration.
  • Keywords
    CMOS analogue integrated circuits; electromagnetic interference; electrostatic discharge; network topology; CMOS process; EMI attenuation; EMI signal coupling; ESD clipping; analog circuit; calibration; chip modification; differential input topology; electromagnetic interference; industrial EMI specification; low input impedance structure; signal deterioration; voltage 40 V; Calibration; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Impedance; Impedance measurement; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2011 Proceedings of the
  • Conference_Location
    Helsinki
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4577-0703-2
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2011.6044900
  • Filename
    6044900