• DocumentCode
    1808034
  • Title

    Analysis of tracking phenomena in silicone rubber insulation material using moving average technique

  • Author

    Sarathi, R. ; Chandrasekarr, S. ; Yoshimura, N.

  • Author_Institution
    Dept. of Electr. Eng., IIT, Chennai, India
  • fYear
    2004
  • fDate
    20-22 Dec. 2004
  • Firstpage
    90
  • Lastpage
    94
  • Abstract
    In the present work, tracking phenomenon in silicone rubber material has been studied under DC voltage, with ammonium chloride as a contaminant. It is observed that the tracking is more severe under the DC voltages. The leakage current during the tracking studies were measured and the moving average technique was adopted to understand the trend in current flow. The leakage current magnitude is high with surface roughened specimens compared to the virgin specimen, irrespective of the type of applied voltage. It is realized that the tracking time and the leakage current magnitude shows an inverse relationship.
  • Keywords
    ammonium compounds; leakage currents; moving average processes; silicone rubber; surface contamination; DC voltage; ammonium chloride contaminant; leakage current magnitude; moving average technique; silicone rubber insulation material; surface roughened specimen; tracking phenomena analysis; Current measurement; Fluid flow measurement; Insulation life; Leakage current; Pollution measurement; Rough surfaces; Rubber; Surface contamination; Surface roughness; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Annual Conference, 2004. Proceedings of the IEEE INDICON 2004. First
  • Print_ISBN
    0-7803-8909-3
  • Type

    conf

  • DOI
    10.1109/INDICO.2004.1497712
  • Filename
    1497712