DocumentCode :
1808223
Title :
Photosensitive phosphorus-doped boron-codoped silica planar waveguide for waveguide Bragg grating prepared by spin coating
Author :
Rahman, Mohd Syuhaimi Ab ; Shaari, Sahbudin
Author_Institution :
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Selangor, Malaysia
fYear :
2002
fDate :
19-21 Dec. 2002
Firstpage :
450
Lastpage :
454
Abstract :
Phosphorous doped silica layers are grown from tetraethylorthosilicate (TEOS), phosphoric acid and PBF polymer, with spin coating technique on silica glass. The phosphorus-doped and boron-codoped photosensitive silica waveguide samples show index modulation around 1×10-4 for thickness between 3 μm to 8 μm. The refractive index range is between 1.51 to 1.54 which is dependent on the coating parameters and concentration of phosphoric acid. Photosensitivity test and treatment are performed using a 366 nm UV source, with 0.36 mW/cm2 power at pulse rate of 50 Hz. All samples show a decrease in refractive indices under the UV exposure. They begin to saturate after first 30-60 minutes in treatment. Further UV exposure will slowly increase again the refractive index. It is estimated that, with a laser source power from ArF and KrF of about 10 mW, the Bragg grating writing duration will be in between 20 to 30 second. The samples were also thermally treated to increase the index modulation by the factor of 10.
Keywords :
Bragg gratings; boron; heat treatment; optical planar waveguides; phosphorus; photochemistry; refractive index; silicon compounds; spin coating; thin film devices; ultraviolet radiation effects; 10 mW; 20 to 30 sec; 3 to 8 micron; 30 to 60 min; 366 nm; 50 Hz; Bragg grating; PBF polymer; SiO2:P,B; TEOS; UV source treatment; heat treatment; index modulation; laser source power; phosphoric acid; photosensitive phosphorus-doped boron-codoped silica; planar waveguide; refractive index; silica glass; spin coating; tetraethylorthosilicate; waveguide Bragg grating; Bragg gratings; Coatings; Glass; Performance evaluation; Planar waveguides; Polymer films; Refractive index; Silicon compounds; Testing; Ultraviolet sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN :
0-7803-7578-5
Type :
conf
DOI :
10.1109/SMELEC.2002.1217863
Filename :
1217863
Link To Document :
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