• DocumentCode
    1808232
  • Title

    Flexible Experimentation and Analysis for Hybrid DEVS and MPC Models

  • Author

    Dongping Huang ; Sarjoughain, H.S. ; Godding, Gary W. ; Rivera, Daniel E.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ
  • fYear
    2006
  • fDate
    3-6 Dec. 2006
  • Firstpage
    1863
  • Lastpage
    1870
  • Abstract
    Discrete-event simulation and control-theoretic approaches lend themselves to studying semiconductor manufacturing supply-chain systems. In this work, we detail a modeling approach for semiconductor manufacturing supply chain systems in a hybrid DEVS/MPC testbed that supports experimentations for DEVS and MPC models using KIBDEVS MPC/. This testbed supports detailed analysis and design of interactions between discrete processes and tactical controller. A set of experiments have been devised to illustrate the role of modeling interactions between discrete event system specification and model predictive control models. The testbed offers novel features to methodically identify and analyze complex model interactions and thus support alternative designs based on tradeoffs between model resolutions and execution times
  • Keywords
    discrete event simulation; discrete event systems; industrial control; integrated circuit manufacture; predictive control; supply chain management; discrete event system specification; discrete-event simulation; hybrid DEVS-MPC models; model predictive control; semiconductor manufacturing supply-chain systems; tactical control; Discrete event simulation; Discrete event systems; Predictive control; Predictive models; Process control; Semiconductor device manufacture; Semiconductor device testing; Supply chains; System testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2006. WSC 06. Proceedings of the Winter
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0500-9
  • Electronic_ISBN
    1-4244-0501-7
  • Type

    conf

  • DOI
    10.1109/WSC.2006.322967
  • Filename
    4117825