Abstract :
This work suggests fuzzy multicriteria analysis as a powerful method for optimal choice of instrumental methods for measuring physical quantities within a common laboratory that supports Small/Medium enterprises (SMEs). The criteria used include time requirements, convenience/simplicity operating and capital cost, precision, trueness, range and robustness, degree of acceptance, and comparability with results obtained by other instrumental methods currently in use by SMEs. A 4-stage Delphi method, especially designed for the needs of the present work, has been applied for the assignment of fuzzy values to the elements of both, the preference matrix and the criteria vector. A case study is also presented, concerning small/medium aluminium anodizers; the physical quantity examined is the thickness of the dielectric anodic oxide film and the alternative instrumental methods considered are eddy currents, mass decrease after chemical stripping, optical microscopy, electron microscopy, beta particles backscattering, double-beam interference microscopy, and electrical breakdown voltage. A robust solution is obtained, confirmed by sensitivity analysis, indicating eddy currents and optical microscopy, as dominant alternatives.
Keywords :
anodisation; decision making; eddy current testing; electric breakdown; electron microscopy; fuzzy set theory; optical microscopy; optimised production technology; particle backscattering; process control; quality control; sensitivity analysis; small-to-medium enterprises; thickness measurement; Delphi method; PROMETHEE; SME; aluminium anodizers; beta particles backscattering; capital cost; chemical stripping; comparability; criteria vector; degree of acceptance; dielectric anodic oxide film thickness; double-beam interference microscopy; eddy currents; electrical breakdown voltage; electron microscopy; fuzzy multicriteria choice; instrumental methods; mass decrease; operating cost; optical microscopy; optimal choice; physical quantities measurement; preference matrix; process control measurements; product quality measurements; sensitivity analysis; time requirements; Aluminum; Dielectric measurements; Eddy currents; Electron microscopy; Electron optics; Instruments; Optical films; Optical microscopy; Optical sensors; Robustness;