Title :
Linearity and intrinsic gain enhancement techniques using positive feedbacks to realize a 1.2-V, 200-MHz, +10.3-dBm of IIP3 and 7th-order LPF in a 65-nm CMOS
Author :
Sugimoto, Yasuhiro
Author_Institution :
Deptartment of Electr., Electron. & Commun. Eng., Chuo Univ., Tokyo, Japan
Abstract :
Linearity and intrinsic gain enhancement techniques for realizing high-performance and low-voltage analog circuits in a deep-submicron CMOS are introduced. In place of a differential amplifier for the voltage-to-current (V/I) conversion at the input, a V/I conversion using a linear resistor and a positive feedback in a pseudo-differential configuration was adopted. The positive feedback concept was also applied to enhance the intrinsic gain of the deep-submicron MOS transistor which is used as a current source to realize high output impedance in amplifiers. In order to verify the effectiveness of the proposed techniques, a MOS 7th-order Gm-C linear phase low-pass-filter (LPF) was realized using a 65-nm CMOS process. Evaluation results showed that the -3 dB frequency bandwidth, group delay ripple, 3rd-order distortion and 3rd-order input intercept point (IIP3) were 200 MHz, 2.2%, less than -55 dB with a 100-MHz input and +10.3 dBm, respectively, all with a ±0.1 Vp-p signal input at each input terminal in pseudo differential configuration, while the LPF including an output buffer dissipated 60 mW from a 1.2-V supply.
Keywords :
CMOS integrated circuits; differential amplifiers; low-pass filters; low-power electronics; CMOS technology; MOS transistor; differential amplifier; frequency 200 MHz; gain enhancement; group delay ripple; linear resistor; low-pass filter; positive feedbacks; power 60 mW; pseudo-differential configuration; size 65 nm; voltage 1.2 V; voltage-to-current conversion; Delay; Gain; Harmonic analysis; Impedance; Resistors; Transconductance; Transistors;
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2011.6044923