DocumentCode :
18088
Title :
Dynamic Analysis of Current-Voltage Characteristics of Nanoscale Gated-Thyristors
Author :
Paolucci, Giovanni M. ; Compagnoni, C. Monzio ; Castellani, N. ; Carnevale, G. ; Fantini, P. ; Ventrice, D. ; Lacaita, Andrea L. ; Spinelli, Alessandro S. ; Benvenuti, A.
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Inf. e Bioingegneria, Milan, Italy
Volume :
34
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
629
Lastpage :
631
Abstract :
This letter presents a detailed experimental investigation of the current-voltage characteristics of deca-nanometer gated-thyristors, highlighting that strong differences exist between the static and the dynamic operation of these devices. In particular, results reveal that the forward-breakover voltage determining thyristor turn-on does not depend only on the applied gate voltage, but also on the rise time of the applied gate pulse, decreasing for fast pulse fronts. This is explained in terms of a higher electron injection from the cathode to the anode triggering device turn-on when the gate switching time is shorter than that required for holes to leave the p-base.
Keywords :
nanoelectronics; thyristors; anode triggering device; applied gate pulse; cathode; current-voltage characteristic dynamic analysis; deca-nanometer gated-thyristors; electron injection; fast pulse fronts; forward-breakover voltage; gate switching time; nanoscale gated-thyristors; thyristor turn-on; Forward-breakover; nanoscale semiconductor devices; semiconductor-device modeling; thyristors;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2253441
Filename :
6497489
Link To Document :
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