Title :
A Heuristically Mechanical Model for Accurate and Fast Soft Error Analysis
Author :
Jiajia Jiao ; Yuzhuo Fu
Author_Institution :
Sch. of Micro Electron., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Characterizing the soft error impacts is significant for a good trade off between design cost (e.g. Area and power) and reliability. In this paper, a heuristically mechanical model is proposed to quantify the soft error metric Architectural Vulnerability Factor (AVF) of storage structures (e.g. Register file and Cache) efficiently. This model not only considers the error spread among successive read operations, but also captures the logical masking effects of ALU unit, where errors propagate from the storage structure. The results of SPEC2000 INT demonstrate that, compared with the state-of-the-art method, the proposed model achieves a more accurate AVF estimation by up to 98.18% and on average 79.14% via only one more simulation for simple profiling.
Keywords :
microprocessor chips; radiation hardening (electronics); ALU unit; architectural vulnerability factor; heuristically mechanical model; logical masking effects; soft error analysis; storage structures; Accuracy; Analytical models; Computational modeling; Error analysis; Estimation; Hidden Markov models; Registers; error spread; masking effects; mechanical model; soft error analysis;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.18