• DocumentCode
    180881
  • Title

    Error Resilient Real-Time State Variable Systems for Signal Processing and Control

  • Author

    Banerjee, Sean ; Gomez-Pau, Alvaro ; Chatterjee, Avhishek ; Abraham, J.A.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    39
  • Lastpage
    44
  • Abstract
    The advent of sensor networks, robots, autonomous vehicles and the smart grid have made the dependability of circuits and systems that control them critical to society and national defense. While significant advances in the design of linear and nonlinear control systems have been made to allow modes of operation not possible in the past, the problem of resilience to errors induced by hostile operating environments remains largely unexplored even though the probability of such errors occurring during real-time operation has increased. In this talk we propose mechanisms for detecting transient errors in control systems and circuitry as well as diagnosing and correcting for their effects on overall system operation. It is shown how real-number checksum encodings of circuit function can be used to detect and correct errors in the plant and feedback subsystems of linear control systems. Applications to signal processing and control algorithms are described. It is shown how errors in motor control electronics can be detected and corrected using the proposed methodology. Finally, extensions to nonlinear control systems are presented.
  • Keywords
    nonlinear control systems; real-time systems; signal processing; autonomous vehicles; motor control electronics; national defense; nonlinear control systems design; real-number checksum encodings; real-time state variable systems; robots; sensor networks; signal processing; smart grid; society; Circuit faults; Control systems; Encoding; Error compensation; Noise; Transient analysis; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.19
  • Filename
    6979074