Title :
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System
Author :
Taewoo Han ; Inhyuk Choi ; Hyunggoy Oh ; Sungho Kang
Author_Institution :
Dept. of Electr. & Electron. Eng. Comput. Syst., Yonsei Univ., Seoul, South Korea
Abstract :
This paper proposes a new parallel test access strategy for multiple identical cores in a network-on-chip (NoC). The proposed test strategy takes advantage of the regular design of NoC to reduce both test area overhead and test time. The proposed NoC reused test access mechanism (TAM) adopted a pipelining structure and a deterministic test data routing algorithm in order to reuse the full bandwidth of links in the NoC. Also, the architecture has complete scalability according to the number of cores and applications for 3D environment are also represented. Experimental results show that the proposed TAM can test multiple cores with the same test time as a single core and negligible hardware overhead.
Keywords :
integrated circuit testing; microprocessor chips; multiprocessing systems; network routing; network-on-chip; NoC-based multicore system; network-on-chip; parallel test access strategy; test access mechanism; test area overhead; test data routing algorithm; Hardware; Multicore processing; Pipeline processing; Routing; System-on-chip; Testing; Three-dimensional displays; NoC; TAM; multiple identical cores; parallel test;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.26