Design, Verification, and Application of IEEE 1687

Author

Zadegan, Farrokh Ghani ; Larsson, Erik ; Jutman, Artur ; Devadze, Sergei ; Krenz-Baath, Rene

Author_Institution

Lund Univ., Lund, Sweden

fYear

2014

fDate

16-19 Nov. 2014

Firstpage

93

Lastpage

100

Abstract

IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today´s integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product´s life time.

Keywords

elemental semiconductors; integrated circuit packaging; integrated circuit testing; printed circuit manufacture; silicon; IEEE 1687 networks; IJTAG; Si; debugging; embedded instruments; fault management; in-field test; integrated circuits; manufacturing test; package test; post-silicon validation; power-on self-test; printed circuit board assemblies; wafer sort; Debugging; Hardware; Instruments; Multiplexing; Registers; Robustness; Schedules; IEEE 1687 (IJTAG); access time; fault management; network design; on-chip instruments; robustness; verification;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ATS), 2014 IEEE 23rd Asian

Conference_Location

Hangzhou

ISSN

1081-7735

Type

conf

DOI

10.1109/ATS.2014.28

Filename

6979083