Title :
On Supporting Sequential Constraints for On-Chip Generation of Post-silicon Validation Stimuli
Author :
Xiaobing Shi ; Nicolici, Nicola
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
Abstract :
Post-silicon validation plays a critical role in exposing design errors in early silicon prototypes. Its effectiveness is conditioned by in-system application of functionally-compliant stimuli for extensive periods of time. This is achieved by expanding on-the-fly randomized functional sequences, which are subjected to user-programmable constraints. In this paper we present a method to extend the existing work for on-chip generation of functionally-compliant randomized sequences with support for sequential constraints.
Keywords :
automatic test pattern generation; electronic engineering computing; integrated circuit testing; functionally-compliant stimuli; in-system application; on-chip generation; post silicon validation stimuli; sequential constraints; user programmable constraints; Binary codes; Clocks; Decoding; Generators; Hardware; Switches; System-on-chip; constrained-random stimuli generator; post-silicon validation;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.30