A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge

Traditional binary transition-edge search methods are sensitive to hysteresis, noise and jitter, and also require a relatively large number of samples in order to accurately detect a noisy transition edge. A new transition-edge search circuit is introduced in this paper which utilizes a stochastic comparator group. By incorporating stochastic properties, our proposed circuit design accelerates the accumulation of data and enhances test quality. The background theory underlying this approach is developed and experimentally validated in this paper.