An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution

Author

Moreira, J. ; Werkmann, Hubert ; Ishida, Makoto ; Roth, Bernhard ; Filsinger, Volker ; Sui-Xia Yang

fYear

2014

fDate

16-19 Nov. 2014

Firstpage

218

Lastpage

223

Abstract

In this paper we will describe a solution to test I/O cells that use four level pulse amplitude modulation (PAM-4) at data rates of 32 Gbaud using a commercial ATE platform without any external instruments. The solution is based on an active test fixture where a retimed digital to analog converter (DAC) is used to generate the PAM-4 stimulus signaling. The comparator side is implemented using a single differential comparator and three consecutive functional tests with different patterns and compare threshold voltages.

Keywords

comparators (circuits); digital-analogue conversion; pulse amplitude modulation; test equipment; DAC; PAM-4 at-speed characterization; PAM-4 stimulus signaling; active test fixture; automated test equipment; commercial ATE platform; consecutive functional tests; data rates; digital to analog converter; external instruments; four level pulse amplitude modulation; single differential comparator side; test I-O cells; testing solution; threshold voltages; Clocks; Coaxial cables; Jitter; Optical signal processing; Power combiners; Standards; Testing; ATE; PAM-4; high-speed digital;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ATS), 2014 IEEE 23rd Asian

Conference_Location

Hangzhou

ISSN

1081-7735

Type

conf

DOI

10.1109/ATS.2014.48

Filename

6979103